3 edition of Assessing and characterizing inter- and intra-die variation using a statistical metrology framework found in the catalog.
Assessing and characterizing inter- and intra-die variation using a statistical metrology framework
by Hewlett-Packard Laboratories, Technical Publications Dept. in Palo Alto, Calif
Written in English
|Statement||R. Divecha ... [et al.].|
|Series||HP Laboratories technical report -- HPL-96-78.|
|Contributions||Divecha, R., Hewlett-Packard Laboratories.|
|The Physical Object|
|Pagination|| p. :|
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